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A BrainRetraction Correction Framework Applying Extended Finite Element Method and Validation |
1 Digital Medical Research Centre, Fudan University, Shanghai 200032, China
2 Shanghai Key Laboratory of Medical Imaging Computing and Computer Assisted Intervention (MICCAI), Shanghai 200032, China |
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Abstract Brain retraction severely decreases the accuracy and reliability of Image Guided Navigation Systems (IGNS). In this paper, we proposed a linear elastic framework in which extended finite element method (XFEM) was used for the correction of the brain retraction. We performed a quantitative assessment of brain retraction framework by the displacement of implanted metal makers in one brain phantom. The average correction error of our XFEM framework varied between 0.3mm and 0.5mm (mean 0.4mm). And the average correction accuracy varied between 83.1% and 87.5% (mean 85.9%). The results of the experiments indicated this framework had a great potential to correct brain retraction.
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