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Lightweight EMG Artifact Detection Method Based on Improved YOLO Model for EEG |
Sun Ge1, Lin Weihong2, Lou Hongwei1, Han Jinbo1* |
1(Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China) 2(Department of Neurology, The First Hospital of Jilin University, Changchun 130021, China) |
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Received: 15 June 2024
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Corresponding Authors:
*E-mail: hanjinbonwu@163.com
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