头皮脑电重测信度的研究进展

doi:10.3969/j.issn.0258-8021.2024.01.011

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Abstract In recent years, the test-retest reliability of EEG has been increasingly emphasized in the exploration of the cognitive neural mechanisms of psychological processes based on scalp electroencephalography (EEG). When developing experimental methods based on scalp EEG to evaluate human brain function, researchers are increasingly concerned about whether these methods are highly reliable. Starting from the main factors that affect the test-retest reliability of EEG, we focused on the impact of the basic experimental process of EEG on the test-retest reliability. Firstly, the commonly used methods for measuring the test-retest reliability of EEG were introduced. Then, from the perspective of experimental methods, the research progress in this field was reviewed, including experimental design, data processing, feature selection, subject group, etc. The main focus was on the impact of data analysis methods on the test-retest reliability. It was pointed out that improving the signal-to-noise ratio of EEG signals and standardizing the preprocessing process are important ways to improve the test-retest reliability of EEG. Finally, ways to improve the test-retest reliability of EEG research were proposed based on the selection of experimental paradigms and features or indicators, and prospects for the development of EEG test-retest research were presented.

Key words： EEG event-related potential test-retest reliability characteristics

Received: 09 June 2022

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R318

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	Articles by authors
	Qin Huiyi
	Wang Yulin
	Lei Xu

Cite this article:

Qin Huiyi,Wang Yulin,Lei Xu. Research Progress of Test-Retest Reliability Based on Scalp EEG[J]. Chinese Journal of Biomedical Engineering, 2024, 43(1): 106-116.

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http://cjbme.csbme.org/EN/10.3969/j.issn.0258-8021.2024.01.011 OR http://cjbme.csbme.org/EN/Y2024/V43/I1/106

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